XRD surface mapping

X-ray diffraction (XRD) surface mapping is a powerful analytical technique widely used in material science, physics, chemistry, and engineering to characterize the crystalline properties and structural variations of materials across a defined surface. By systematically measuring diffraction patterns across different points on a sample’s surface, XRD surface mapping enables researchers to obtain detailed spatial information on crystallographic orientation, strain, phase distribution, and texture. This data is invaluable for applications ranging from thin-film analysis and semiconductor development to stress analysis in metals and composite materials.

The ability to map these properties across a surface provides insights into uniformity, quality, and performance, making XRD surface mapping a critical tool in quality control, failure analysis, and research & development for advanced materials. Through this technique, scientists and engineers gain a deeper understanding of material behavior and can optimize properties for specific applications, driving innovation in industries such as electronics, aerospace, automotive, and biomedical engineering