What limits the performance of your detector material?
Electrically active defects? Carrier lifetime? Trapping and recombination? Luminescence response?
These are some of the questions we look forward to discussing at IEEE NSS MIC RTSD 2026* in Granada.
The conference brings together researchers and industry experts working across radiation detection, room-temperature semiconductor detectors, medical imaging, dosimetry and emerging detector technologies.
For Freiberg Instruments, three areas of our measurement portfolio connect particularly well with this community:
Contactless semiconductor characterization
Our MDP and SPV systems help investigate material quality, carrier lifetime, photoconductivity, electrically active defects and surface or interface properties. MDpicts pro adds temperature-dependent, spatially resolved characterization for a broad range of semiconductor materials.
Luminescence and dosimetry
The modular lexsygresearch platform supports TL, OSL and related luminescence methods – from fundamental research to dosimetric applications.
Crystal orientation
Where crystallographic orientation matters, our XRD portfolio provide fast and precise measurements for material research and quality control.
Working on detector materials, dosimetry or luminescence? Let’s meet in Granada and talk about what you need to measure.
IEEE NSS MIC RTSD 2026*
Granada, Spain
November 7–14, 2026
*IEEE NSS MIC RTSD 2026 is the Nuclear Science Symposium, Medical Imaging Conference and International Symposium on Room Temperature Semiconductor Detectors.