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Electrical semiconductor characterization
Luminescence dating, research, dosimetry and more
Contamination monitor, beta-aerosol monitor, dose rate meter and more
Mono- and Multi-crystalline wafer lifetime measurement device
State of the art system for topographic electrical characterization of multicrystalline bricks in fabs with high throughput....
Production integrated high speed wafer mapping of carrier lifetime. Single wafer topograms in less than one second a wafer.
Low cost table top lifetime measurement system for characterization of a variety of different silicon samples at different...
Mono- and Multi-crystalline wafer and brick lifetime measurement device
Flexible OEM unit for lifetime measurements at a variety of different samples ranging from mono- to multicrystalline silicon...
Microwave Detected Photo Induced Current Transient Spectroscopy
The minority carrier life time is sensitive for all kinds of electrically active defects in semiconductors and is therefore...
MDP is an advanced technology with a so far unsurpassed combination of sensitivity, speed and resolution for fab and lab...
for quality control of bifacial PERC/PERC+ solar cells and more
portable in field PID tester for solar modules
user friendly and advanced operating software
The PIDcon devices are designed to investigate the PID susceptibility for production monitoring of solar cells as well as tests...
Learn more about the reasons for PID and the how the susceptibility of solar cells, mini modules and encapsulation materials can...
For ultra-fast crystal orientation and rocking curve measurements
Flexible diffractometer for ultra-fast Omega Scan orientation determination
Smart diffractometer for ultra-fast Omega-scan of small samples.
Robust XRD equipment for fully automated in-line testing & alignment
for blanks, wafers & bars (AT, SC, TF, etc.)
three generations of X-ray engineers
in industrial production, R&D and more
discover the most convenient way of measuring orientation of single crystals
Our quality management system is an integrated process-oriented system with ISO 9001 certification.
Components built from NLO materials have to fulfill high quality standards at the crystal surface and within the bulk material. The orientation of the optical axis, in most cases equal to the crystal c axis, is important for optical applications.
Compared to typical anorganic metals, semiconductors and insulators, the NLO materials have more complicated crystal structures with lower symmetry. The structure creates a highly anisotropic environment for light transmitted through the crystal, and causes their special properties. These crystals are usually cut into small bars with dimensions in the millimeter range to be used as active elements in frequency multipliers and optical parametric oscillators. A surface quality determination on such small crystals can often reveal structural faults and cracks within the crystal.
The large unit cells of these materials are a challenge for the Omega Scan method. We were able to determine Omega Scan parameter for the most important orientations of many NLO materials like LBO, BBO and TeO2. Some special modifications were made to the Omega/Theta design to include NLO capabilities for several different materials.